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DFT Gasket Verification Using JTAG Protocol

Year: 2025

Type: conference-paper

Source: International Conference on Smart Systems for Applications in Electrical Sciences (ICSSES)

DOI: 10.1109/icsses64899.2025.11009289

Authors: Gagana B L, Panwala Fenil Chetankumar, Dayananda Y S

Institution: Siddaganga Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411205307

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