Work

Optimal Defect Testing of Radiation-Tolerant SRAM for Spacecraft Avionics

Year: 2025

Type: conference-paper

DOI: 10.1109/ictest64710.2025.11042671

Authors: Padmapriya K., Rahul Anilkumar, J. Krishna Kishore, Debjyoti Mallik, Swastika Upadhyay, Sumit Soin

Institutions: Indian Space Research Organisation, U. R. Rao Satellite Centre, Ministry of Electronics and Information Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411601182

FWCI:

Cites: 15

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Related to: 10