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A 90%-Random Fault Coverage Area-Efficient LED Driver Current Monitor

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas56072.2025.11043250

Authors: Antonio Colucci, Massimo Rigo, Alessandro Carbonini, Carlo Fiocchi, Piero Malcovati, Edoardo Bonizzoni

Institution: University of Pavia

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411724778

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Cites: 6

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Related to: 10