Work

Robust Defect Detection for Phase-Locked Loops using All-Digital Built-In Self-Test (BIST) Circuitry

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas56072.2025.11044075

Authors: Michael Sekyere, Marampally Saikiran, Rob Butler, Reed Adams, Degang Chen

Institutions: Iowa State University, Texas Instruments (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Semiconductor Research Corporation

OpenAlex ID: W4411724779

FWCI: 1.786

Cites: 14

Cited by: 2

Related to: 10