Work

Enabling Fault Isolation in Fault Injection for Automotive-grade Circuits Simulation

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas56072.2025.11043996

Authors: Yulong Liu, Junhao Lin, Yuheng Li, Pingsheng Zhang, Zenan Yan, Yuan Wang, Song Jia

Institution: Peking University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411724956

FWCI: 0.928

Cites: 15

Cited by: 1

Related to: 10