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Artificial Intelligence based Test Vector Reordering for Optimal Test Power Reduction

Year: 2025

Type: conference-paper

Source: International Conference on Recent Advances in Electrical, Electronics, Ubiquitous Communication, and Computational Intelligence (RAEEUCCI)

DOI: 10.1109/raeeucci63961.2025.11048249

Authors: Sohom Dasgupta, R Sakthivel

Institution: Vellore Institute of Technology University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411726156

FWCI:

Cites: 12

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Related to: 10