Work

Analog Circuit Fault Diagnosis Algorithm Based on KPCA Feature Optimization Combined with Improved GA - SVM

Year: 2025

Type: conference-paper

Source: Asia Conference on Power and Electrical Engineering (ACPEE)

DOI: 10.1109/acpee64358.2025.11041448

Authors: Li Yunfeng, Cai Ziwen, Luan Wenpeng, Zhao Yun, Lu Yuxin, Liu Xipeng

Institutions: Tianjin University, China Southern Power Grid (China)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Key Research and Development Program of China

Award: G7303245957

OpenAlex ID: W4411726836

FWCI: 0.928

Cites: 10

Cited by: 1

Related to: 10