Work

Data Retention in Co-Doped Hzo Fecaps: Roles of Fe Thickness and Thermal Budget

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11040648

Authors: Justine Barbot, Markus Peller, Isaac Emanuel Robert, Kerstin Bernert, Hannes Mähne, Steffen Thiem, David Lehninger, Ayse Sünbül, Konrad Seidel, Thomas Kämpfe

Institutions: X-Fab (Germany), Fraunhofer Institute for Photonic Microsystems, Center Nanoelectronic Technologies

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411799268

FWCI: 2.358

Cites: 5

Cited by: 1

Related to: 10