Work

K_Means Clustering for Scan Chain Stitching

Year: 2025

Type: conference-paper

Source: IEEE International Conference on VLSI Systems, Architecture, Technology and Applications (VLSI SATA)

DOI: 10.1109/vlsisata65374.2025.11070006

Authors: Chilukuri Karthik Chandra, Anita J P

Institution: Amrita Vishwa Vidyapeetham

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4412404841

FWCI: 1.856

Cites: 12

Cited by: 2

Related to: 10