Work

Advanced Fault Diagnosis of CMOS Circuit Design by Leakage Measurement in Nanometer Technology

Year: 2025

Type: conference-paper

Source: IEEE International Conference on VLSI Systems, Architecture, Technology and Applications (VLSI SATA)

DOI: 10.1109/vlsisata65374.2025.11070065

Authors: Vijayaprabhuvel Rajavel, Reyansh Gahlot

Institution: Thapar Institute of Engineering & Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412405538

FWCI: 2.785

Cites: 11

Cited by: 3

Related to: 10