Work

Development of a General-Purpose Board for Debugging Test Solutions for Dual-Channel Gate Drivers Up to 1200 Volts

Year: 2025

Type: conference-paper

Source: International Conference on IC Design and Technology

DOI: 10.1109/icicdt65192.2025.11078126

Authors: Syed Adeel Ali Shah, Andrea Baschirotto

Institution: University of Milano-Bicocca

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413067622

FWCI:

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