AI Driven Fault Detection for Advanced Digital VLSI Systems
Year: 2025
Type: conference-paper
Authors: Allimilli Devi Naga Sai, Anamdasu Uday Sai Kumar, Mathan N, Anbarasi Jebaselvi G D, N M Nandhitha
Institution: Sathyabama Institute of Science and Technology
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413096249