Work

Towards Model-Driven Circuit Test Development: SysMLv2-Based Test Modeling and Assisted Workflow

Year: 2025

Type: conference-paper

DOI: 10.1109/ssi65953.2025.11107217

Authors: Sanaz Ghazavi, Ali Kareem Abdulrazzaq, Franziska Mayer, Christian Schott, Erik Markert, Ulrich Heinkel

Institution: Chemnitz University of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413205548

FWCI:

Cites: 12

Cited by:

Related to: 10