Optimizing Multi-Class Fault Detection in Digital Circuits Using a Hybrid Ensemble of Random Forest and XGBoost
Year: 2025
Type: conference-paper
Authors: Anju Yajjala, Dr A Ravi, G Bhanu Chander
Institution: Indian Institute of Information Technology Kottayam
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413679741