Work

High-Resolution and High-Speed Inspection Technology for CT-Type Automated X-Ray Inspection Systems

Year: 2025

Type: article

Source: Journal of The Japan Institute of Electronics Packaging

DOI: 10.5104/jiep.28.570

Author: Makoto Shichiro

Institution: Omron (Japan)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413864850

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