Year: 2025
Type: article
Abstract: ABSTRACT A 2H‐TaS 2 (0001) single crystal was studied with XPS. The quantification and fitting procedures for this material are discussed in detail. It is shown that conventional approaches for data deconvolution fail, and an in‐depth analysis utilising theoretical sensitivity factors and taking into account the shake‐up and loss structures is needed to produce accurate results. Additionally, the inherent asymmetry of the Ta and S peaks is highlighted, and appropriate line shapes are determined.
Source: Surface and Interface Analysis
DOI: 10.1002/sia.70013
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $3,580
Awards: HarwellXPS: A National Research Facility in XPS, G1278519414, G1626821369, HarwellXPS: A National Research Facility in XPS, G229551657, G3405814578, HarwellXPS: Renewal of NRF in Photoelectron spectroscopy, G3748897288, G4522418412, The UK Catalysis Hub - 'Science': 1 - Optimising, predicting and designing new Catalysts, G6659993949, The UK Catalysis Hub - 'Science': 2 Catalysis at the Water-Energy Nexus, Hub 'Science' 3: Catalysis for the Circular Economy and Sustainable Manufacturing, G7679617292, HarwellXPS: A National Research Facility in XPS, Harwell XPS, The UK Catalysis Hub -'Core'
OpenAlex ID: W4413871534
