Work

Considerations on the XPS Analysis of 2H‐TaS 2 (0001)

Year: 2025
Type: article
Abstract: ABSTRACT A 2H‐TaS 2 (0001) single crystal was studied with XPS. The quantification and fitting procedures for this material are discussed in detail. It is shown that conventional approaches for data deconvolution fail, and an in‐depth analysis utilising theoretical sensitivity factors and taking into account the shake‐up and loss structures is needed to produce accurate results. Additionally, the inherent asymmetry of the Ta and S peaks is highlighted, and appropriate line shapes are determined.
Language: English
Open Access status: hybrid
Estimated APC paid: $3,580
OpenAlex ID: W4413871534
FWCI: 0.831
Cites: 47
Cited by: 4
Related to: 10