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Automated BIST Technique for Interconnect Characterization and Reliability Enhancement in Flexible Electronic Circuits

Year: 2025

Type: conference-paper

Source: IEEE International Test Conference India (ITC India)

DOI: 10.1109/itcindia66078.2025.11141572

Authors: Harshad Singh, Kirti Srivastava, Oppili Prasad L

Institution: Indian Institute of Technology BHU

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413917121

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Cites: 13

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Related to: 10