Work

Novel Approach for Implementation and Validation of Scan Dump Debug Methodology

Year: 2025

Type: conference-paper

Source: IEEE International Test Conference India (ITC India)

DOI: 10.1109/itcindia66078.2025.11141625

Authors: Savan Bhatelia, Mahesh Bendre

Institution: Intel (India)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413917140

FWCI:

Cites: 7

Cited by:

Related to: 10