Work

Optimized Grouping for Packetized Scan Solutions

Year: 2025

Type: conference-paper

Source: IEEE International Test Conference India (ITC India)

DOI: 10.1109/itcindia66078.2025.11141637

Authors: Bhavika Ranjeet Kumar, Aalhad Deshpande, Rama Sireesha Arisetti, Maheedhar Jalasutram

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413917166

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Cites: 10

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Related to: 10