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Hybrid Bscan and Self-Test IOs to Reduce IO Test Time

Year: 2025

Type: conference-paper

Source: IEEE International Test Conference India (ITC India)

DOI: 10.1109/itcindia66078.2025.11141570

Authors: Mathangi Raghuraman, Sujith Thomas, Sharmila Jayakumar, Ramakrishnan Subramanian

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413917262

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Cites: 8

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Related to: 10