Work

Lite-CMOS Transition Fault Model (CTFM) for Legacy Design(s)

Year: 2025

Type: conference-paper

Source: IEEE International Test Conference India (ITC India)

DOI: 10.1109/itcindia66078.2025.11141619

Authors: Yi Sun, Qiong Wang, Saidapet Ramesh, Cunyu Shi

Institutions: NXP (United States), NXP (Germany)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413917289

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Cites: 8

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Related to: 10