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From Structural Test Escapes to Silent Data Errors: A Preliminary Analysis

Year: 2025

Type: conference-paper

Source: IEEE International Test Conference India (ITC India)

DOI: 10.1109/itcindia66078.2025.11141623

Authors: Francesco Angione, Paolo Bernardi, Arani Sinha

Institutions: Politecnico di Torino, Intel (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413917299

FWCI:

Cites: 20

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Related to: 10