Work

Concurrent ATE Testing of MSIP PHYs in SOC via Scan Streaming Fabric

Year: 2025

Type: conference-paper

Source: IEEE International Test Conference India (ITC India)

DOI: 10.1109/itcindia66078.2025.11141578

Authors: Kriti Sundar Das, Paras Jain, Harini Kulkarni

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413917445

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Cites: 4

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Related to: 10