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A Machine Learning Based Built-In Self-Test Method for Lifetime Frequency Drift Compensation of Precision Oscillators

Year: 2025

Type: conference-paper

Source: IEEE International Test Conference India (ITC India)

DOI: 10.1109/itcindia66078.2025.11141615

Authors: Ritik Gupta, Aswin Raj, Rubin Parekhji, Gaurab Banerjee

Institutions: Indian Institute of Science Bangalore, Texas Instruments (India)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413917579

FWCI: 0.928

Cites: 20

Cited by: 1

Related to: 10