Work

TOPS: Topology-Based Partial Scan for Stuck-At and Delay Testing

Year: 2025

Type: article

Source: IEEE Transactions on Circuits and Systems I Regular Papers

DOI: 10.1109/tcsi.2025.3604482

Authors: Sangjun Lee, Jongho Park, Jaeyoung Joung, Jaehyun Kim, Laesang Jung, Sungho Kang

Institution: Yonsei University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Samsung

OpenAlex ID: W4413966895

FWCI:

Cites: 22

Cited by:

Related to: 10