Work

XPS Insight Note—Strategies for Obtaining Peak Shapes and Inferring Chemistry

Year: 2025

Type: article

Abstract: ABSTRACT The chemical specificity of x‐ray photoelectron spectroscopy (XPS) for the analysis of surfaces is well established. However, overlapping peaks and complex peak shapes can hinder routine analysis of spectra. Studies involving controlled changes to samples to systematically change photoelectron spectra can reveal invaluable information on peak shapes and hidden spectral features. This insight note is presented to educate users in embracing and utilising changes in spectra to facilitate spectral analysis.

Source: Surface and Interface Analysis

DOI: 10.1002/sia.70014

Authors: D. J. Morgan, M. A. Isaacs, A. Graf

Institutions: Research Complex at Harwell, Cardiff University, University College London

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $3,580

Funder: Engineering and Physical Sciences Research Council