Work

AI-Based Design of an Efficient Final Test Scheme

Year: 2025

Type: conference-paper

DOI: 10.1109/icaidt66272.2025.00107

Authors: Chunmei Pei, Gongsheng Zhu, Guoying Wang, Shuo Wang

Institutions: Beijing University of Technology, Beijing Polytechnic University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Beijing Polytechnic University

Award: G859243879

OpenAlex ID: W4414055106

FWCI:

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