Work

Analysis and Design of Memory Testing Algorithm for Computing-in-Memory Using MBIST

Year: 2025

Type: article

Source: ACM Journal on Emerging Technologies in Computing Systems

DOI: 10.1145/3766540

Authors: Zhiting Lin, Siyan Li, Qiuming Zhang, Qiushi Feng, Changxin Yue, Jiaqi Chen, Yuanyang Wang, Yunlong Liu, Yu Liu, Licai Hao, Chunyu Peng, Qiang Zhao, Yongliang Zhou, Chenghu Dai, Xiulong Wu

Institution: Anhui University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: Natural Science Foundation for Distinguished Young Scholars of Anhui Province, National Natural Science Foundation of China, Anhui Provincial Key Research and Development Plan

Awards: G2970710660, G3783266103, G4271637611, G6824512897, G8331222254

OpenAlex ID: W4414210705

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Cites: 42

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