Analog circuit fault diagnosis based on across space-channel attention and double 1D-convolution network
Year: 2025
Type: article
Source: Engineering Research Express
Authors: Yuanfeng Zhang, Yilin Lu, Hao Huang, Lijian Zhou
Institution: Qingdao University of Technology
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Award: G1121547894
OpenAlex ID: W4414396367