Work

Data-Driven Soft Fault Diagnosis for Analog Circuits Based on Contrastive Learning

Year: 2025

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2025.3612648

Authors: Naixin Zhou, Jiaxin Huang, Yijiu Zhao, Shibo Chen, Jiaming Zhao, Feiyu Long

Institutions: University of Electronic Science and Technology of China, Mohamed bin Zayed University of Artificial Intelligence

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: Natural Science Foundation of Sichuan Province, Fundamental Research Funds for the Central Universities

Awards: G5203752927, G7432911883

OpenAlex ID: W4414404874

FWCI: 2.928

Cites: 33

Cited by: 4

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