Work

Scalable Yield Analysis of SRAM and Analog Circuits Using Multi-Kernel Sparse Representation

Year: 2025

Type: article

Source: ACM Transactions on Design Automation of Electronic Systems

DOI: 10.1145/3767165

Authors: Ziqi Wang, Liangji Wu, Xiaoyong Li, Zhongxi Guo, Xiao Shi, Longxing Shi

Institutions: Southeast University, Southeast University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Jiangsu Province

Awards: G1448638579, G903443910

OpenAlex ID: W4414594412

FWCI:

Cites: 37

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