Year: 2025
Type: article
Abstract: In today's VLSI SoC designs, embedded memories dominate die area and often limit manufacturing yield. Design-for-Testability (DFT) is crucial for detecting manufacturing defects early and ensuring robust design validation. Among DFT techniques, Memory Built-In Self-Test (MBIST) plays a pivotal role by embedding test and repair logic within memory subsystems. MBIST facilitates detection of memory faults such as stuck-at, transition, coupling, and retention faults, using March algorithms and fault models.
Author: Sandeep Santosh
Institution: National Institute of Technology Kurukshetra
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W4414822231
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