Work

Efficient Parallel Testing and Implicit Cost-Driven Tuning of RF-MIMO Systems

Year: 2025

Type: article

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2025.3526125

Authors: Suhasini Komarraju, Sabyasachi Deyati, Abhijit Chatterjee

Institutions: Georgia Institute of Technology, Intel (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Science Foundation, Semiconductor Research Corporation

Awards: EFFICIENT TESTING AND POST-MANUFACTURE TUNING OF BEAMFORMING MIMO WIRELESS COMMUNICATION SYSTEMS: ALGORITHMS AND INFRASTRUCTURE, G4372060807

OpenAlex ID: W4415221884

FWCI:

Cites: 25

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