Work

Noise Propagation and Statistic Variability in MOSFETs Using Probability Density Functions

Year: 2025

Type: article

Source: Fluctuation and Noise Letters

DOI: 10.1142/s0219477525400255

Authors: Raphael Chatzipantelis, Loukas Chevas, Nikolaos Makris, Matthias Bucher

Institutions: Technical University of Crete, Foundation for Research and Technology Hellas

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4417068124

FWCI: 0.462

Cites: 9

Cited by: 2

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