Work

Quantitative Scanning Electron Microscopy

Year: 1976

Type: article

Source: Transactions of the American Microscopical Society

DOI: 10.2307/3225074

Authors: Timothy K. Maugel, D. B. Holt, M. D. Muir, P. R. Grant, I. M. Boswarva

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W594447808

FWCI: 10.53

Cites:

Cited by: 290

Related to: 10