Work

Effect of Ion Magnetron Sputtering Method on Scanning Electron Microscopy (SEM)Images of Materials with Different Surface Properties

Year: 2024

Type: article

Source: DOAJ (DOAJ: Directory of Open Access Journals)

DOI: 10.16577/j.issn.1001-1560.2024.0275

Author: ZHANG Jie, ZOU Junwen, LIU Xueguang, LI Xiaoying

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W6962855784

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