Work

Scan chain clustering for test power reduction

Year: 2008

Type: conference-paper

Source: ACM/IEEE Design Automation Conference (DAC)

DOI: 10.1145/1391469.1391680

Authors: Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Maeding

Institutions: University of Stuttgart, IBM (Germany)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2118966417

FWCI: 1.957

Cites: 31

Cited by: 25

Related to: 9