Work

Design of Test Wrapper Scan Chain Based on Differential Evolution

Year: 2013

Type: article

Abstract: Integrated Circuit has entered the era of design of the IP-based SoC (System on Chip), which makes the IP core reuse become a key issue.SoC test wrapper design for scan chain is a NP Hard problem, we propose an algorithm based on Differential Evolution (DE) to design wrapper scan chain.Through group's mutation, crossover and selection operations, the design of test wrapper scan chain is achieved.Experimental verification is carried out according to the international standard benchmark ITC'02.The results show that the algorithm can obtain shorter longest wrapper scan chains, compared with other algorithms.

Source: Journal of Engineering Science and Technology Review

DOI: 10.25103/jestr.062.03

Authors: Aijun Zhu, Zhi Li, Wangchun Zhu, Chuanpei Xu

Institutions: Xidian University, Guilin University of Aerospace Technology, Guilin University of Electronic Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: diamond

Funders: National Natural Science Foundation of China, Natural Science Foundation of Guangxi Province

Award: 基于量子算法的SOC测试规划研究