Work

Measurement Based Diagnosis of Bridging Faults in Full Scan Circuits

Type: article

Authors: Sreejit Chakravarty, Suresh Sivaprakasam

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7096356541

Cites:

Cited by:

Related to: 9