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Efficient Test Generation with Maximal Crosstalk-Induced Noise using Unconstrained Aggressor Excitation

Type: article

Authors: Daniel Tille, Rolf Drechsler

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7097424765

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