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Scan-shift Power Reduction Based on Scan Partitioning and Q̄-D Connection

Type: article

Authors: Tiebin Wu, Li Zhou, Hengzhu Liu

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7097765062

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Related to: 10