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A Reconfigurable Shared Scan-in Architecture Samitha Samaranayake * Emil Gizdarski* * Nodari Sitchinava*

Type: article

Authors: Frederic Neuveux, Rohit Kapur, T. W. Williams

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7101175583

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