Work

Contrast reversal in electron beam-induced current imaging of carbon nanotube devices governed by secondary electron emission

Year: 2026

Type: article

Source: Nanotechnology

DOI: 10.1088/1361-6528/ae3766

Authors: Xiaoxiao Guan, Boxiang Zhang, Zhiyong Zhang, Chuanhong Jin

Institutions: Ji Hua Laboratory, Xiangtan University, Zhejiang University, Peking University

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: Jihua Laboratory, National Key Research and Development Program of China

Awards: G1132090337, G8754574993

OpenAlex ID: W7123747550

FWCI:

Cites: 39

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