Work

Hard X-ray Photoelectron Spectroscopy for Depth-Resolved Analysis of Optoelectronic and Photoelectrochemical Devices

Year: 2026

Type: article

Source: The Journal of Physical Chemistry Letters

DOI: 10.1021/acs.jpclett.5c03611

Authors: Chao Feng, Yanbo Li

Institution: University of Electronic Science and Technology of China

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, China Postdoctoral Science Foundation, Natural Science Foundation of Sichuan Province, National Key Research and Development Program of China

Awards: G132069644, G3058284370, G317941747, G6247441357, G7431635544, G8430210231

OpenAlex ID: W7126087346

FWCI: 9.714

Cites: 77

Cited by: 7

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