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Functional Fault Impact Probability Prediction using Spatio-Temporal Graph Convolutional Network

Year: 2026

Type: article

Source: ACM Transactions on Design Automation of Electronic Systems

DOI: 10.1145/3798106

Authors: Shaoqi Wei, Senling Wang, Hiroshi Kai, Yoshinobu Higami, Ruijun Ma, Tianming Ni, Xiaoqing Wen, Hiroshi Takahashi

Institutions: Ehime University, Anhui University of Science and Technology, Anhui Polytechnic University, Kyushu Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G1063466416

OpenAlex ID: W7130842953

FWCI: 14.37

Cites: 43

Cited by: 2

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