Work

Inhomogeneous Charge Carrier Density in Wafer-Scale MoS 2 Caused by Locally Varying Substrate Doping

Year: 2026

Type: article

Source: ACS Applied Materials & Interfaces

DOI: 10.1021/acsami.6c00562

Authors: Henrik Myja, Mohamed Abdelbaky, Sofiia Ustenko, Pawan Kumar, Benjamin Groven, Henry Medina Silva, Pierre Morin, Wolfgang Mertin, Tilmar Kümmell, Gerd Bacher

Institutions: University of Duisburg-Essen, IMEC

Language: English

Topic: 2D Materials and Applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7147665723

FWCI: 1.447

Cites: 64

Cited by: 1

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