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W. Mertin
Observed names:
Mertin, Wolfgang,
W Mertin,
Wolfgang Mertin
Institution:
University of Duisburg-Essen
Observed institutions:
Princeton University,
Fraunhofer Institute for Microelectronic Circuits and Systems,
University of Duisburg-Essen
ORCID:
0000-0001-6792-6033
Observed ORCID:
0000-0001-6792-6033
OpenAlex ID:
A5029221381
The effect of degree of reduction on the electrical properties of functionalized graphene sheets
2013
·
Christian Punckt
, Franziska Muckel
, et al.
·
Applied Physics Letters
·
127
Local Voltage Drop in a Single Functionalized Graphene Sheet Characterized by Kelvin Probe Force Microscopy
2011
·
Liang Yan
, Christian Punckt
, et al.
·
Nano Letters
·
86
Material and doping transitions in single GaAs-based nanowires probed by Kelvin probe force microscopy
2009
·
S Vinaji
, A Lochthofen
, et al.
·
Nanotechnology
·
41
Low Resistive Edge Contacts to CVD‐Grown Graphene Using a CMOS Compatible Metal
2017
·
Mehrdad Shaygan
, Martin Otto
, et al.
·
Annalen der Physik
·
40
PDF
Spatially resolved photoelectric performance of axial GaAs nanowire pn-diodes
2011
·
Andrey Lysov
, Sasa Vinaji
, et al.
·
Nano Research
·
32
Electrical investigation of V-defects in GaN using Kelvin probe and conductive atomic force microscopy
2008
·
A. Lochthofen
, W. Mertin
, et al.
·
Applied Physics Letters
·
30
Monolithic gallium arsenide cantilever for scanning near-field microscopy
1998
·
S Heisig
, H.-U Danzebrink
, et al.
·
Ultramicroscopy
·
28
On the origin of contact resistances in graphene devices fabricated by optical lithography
2016
·
Carlos Alvarado Chavarin
, Abhay A. Sagade
, et al.
·
Applied Physics A
·
25
Voltage drop in an (AlxGa1−x)0.5In0.5P light-emitting diode probed by Kelvin probe force microscopy
2006
·
Kl.-D. Katzer
, W. Mertin
, et al.
·
Applied Physics Letters
·
23
Graphene as a Transparent Conductive Electrode in GaN-Based LEDs
2022
·
Hehe Zhang
, Jan Mischke
, et al.
·
Materials
·
18
PDF
Transfer-free, scalable photodetectors based on MOCVD-grown 2D-heterostructures
2021
·
Ulrike Hutten
, Leon Daniel
, et al.
·
2D Materials
·
17
PDF
Role of Surface Adsorbates on the Photoresponse of (MO)CVD-Grown Graphene–MoS2 Heterostructure Photodetectors
2022
·
Yannick Beckmann
, Annika Grundmann
, et al.
·
ACS Applied Materials & Interfaces
·
16
Self-Powered Photodetectors Based on Scalable MOCVD-Grown WS2–MoS2 Heterostructures
2024
·
Yannick Beckmann
, Henrik Myja
, et al.
·
ACS Photonics
·
14
Direct growth of graphene on Ge(100) and Ge(110) via thermal and plasma enhanced CVD
2020
·
Bilge Bekdüz
, Umut Kaya
, et al.
·
Scientific Reports
·
14
PDF
Direct growth of graphene on GaN via plasma-enhanced chemical vapor deposition under N 2 atmosphere
2020
·
Jan Mischke
, Joel Pennings
, et al.
·
2D Materials
·
14
PDF
Two-dimensional field mapping in MMIC-substrates by electro-optic sampling technique
2003
·
W. Mertin
, C. Bohm
, et al.
·
IEEE MTT-S International Microwave Symposium digest
·
14
Two-dimensional direct electra-optic field mapping in a monolithic integrated GaAs amplifier
1993
·
G. David
, S. Redlich
, et al.
·
European Microwave Conference (EuMC)
·
14
Probe tip invasiveness at indirect electro-optic sampling of MMIC
2002
·
W. Mertin
, C. Roths
, et al.
·
IEEE MTT-S International Microwave Symposium digest
·
13
Cantilever influence suppression of contactless IC-testing by electric force microscopy
1998
·
V. Wittpahl
, U. Behnke
, et al.
·
Microelectronics Reliability
·
13
Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements
1994
·
W. Mertin
, A. Leyk
, et al.
·
Microelectronic Engineering
·
11
Time resolved near-field scanning optical microscopy
1994
·
C Bohm
, J Bangert
, et al.
·
Journal of Physics D Applied Physics
·
10
Surface Degradation of Mg2X-Based Composites at Room Temperature: Assessing Grain Boundary and Bulk Diffusion Using Atomic Force Microscopy and Scanning Electron Microscopy
2024
·
Sanyukta Ghosh
, Mohamed Abdelbaky
, et al.
·
ACS Applied Materials & Interfaces
·
9
Graphene‐Enhanced UV‐C LEDs
2024
·
Johanna Meier
, Hehe Zhang
, et al.
·
Advanced Materials
·
9
PDF
Electron beam testability of monolithic microwave integrated circuits (MMIC)
1990
·
Wolfgang Mertin
, Klaus Dieter Herrmann
, et al.
·
Microelectronic Engineering
·
9
Band structure alignment in transfer-free MOCVD grown 2D-TMDC heterostructures revealed by ambient KPFM
2025
·
M. Abdelbaky
, Y. Beckmann
, et al.
·
APL Materials
·
8
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Works count:
79
Citation count:
772
H-index:
14
I10-index:
21
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