Electron beam testability of monolithic microwave integrated circuits (MMIC)
Year: 1990
Type: article
Source: Microelectronic Engineering
Institution: University of Duisburg-Essen
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Deutsche Forschungsgemeinschaft
OpenAlex ID: W2028083874