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An investigation into the application of artificial intelligence for false reject screening in advanced System-on-Chip final testing

Year: 2026

Type: article

Source: Journal of the Chinese Institute of Engineers

DOI: 10.1080/02533839.2026.2690233

Authors: Ting-Fu Chen, Chih-Chen Hsu, Cheng-Chieh Yu, Sheng-Guan Hong

Institutions: National Central University, National Taichung University of Science and Technology, National Chengchi University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Science and Technology Council

Award: Option Pricing and Parameter Estimation under a Regime-Switching Correlated Jump

OpenAlex ID: W7166125337

FWCI:

Cites: 10

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