Work

Design and fault classification of charge pump PLLs using statistical learning

Year: 2026

Type: article

Source: International Journal of Electronics

DOI: 10.1080/00207217.2026.2724110

Authors: Ramesh J, Govindaraj Vellingiri, Sharmila Devi S, Ezhilazhagan C

Institutions: PSG College of Technology, Karlsruhe Institute of Technology, Dr. N.G.P. Institute of Technology, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Institute of Science and Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7204477541

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Cites: 20

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